A modified thermogravimetric analysis apparatus of improved performanceFRAENKEL, Dan; ANDERSEN, Peter C; COOPER, Gerald et al.Industrial & engineering chemistry research. 2002, Vol 41, Num 7, pp 1885-1891, issn 0888-5885Article

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Reconstruction of low-count step-like signals in ion microbeam analysisKOVACS, Miklos; KANTOR, Zoltan; SIMON, Aliz et al.Vacuum. 2003, Vol 71, Num 1-2, pp 53-57, issn 0042-207X, 5 p.Conference Paper

An approach to determine the chemical composition in InGaN/GaN multiple quantum wellsZHOU, S. Q; WU, M. F; HOU, L. N et al.Journal of crystal growth. 2004, Vol 263, Num 1-4, pp 35-39, issn 0022-0248, 5 p.Article

Monte Carlo simulation of an analytical glow discharge: motion of electrons, ions and fast neutrals in the cathode dark spaceBOGAERTS, A; VAN STRAATEN, M; GIJBELS, R et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1995, Vol 50, Num 2, pp 179-196, issn 0584-8547Article

A microfluidic pH-regulation system based on printed circuit board technologyLÄRITZ, C; PAGEL, L.Sensors and actuators. A, Physical. 2000, Vol 84, Num 3, pp 230-235, issn 0924-4247Article

Exit angle dependence of charge-state distribution of backscattered He ionsSASAKAWA, Kaoru; NAKAJIMA, Kaoru; SUZUKI, Motofumi et al.Applied surface science. 2009, Vol 256, Num 4, pp 965-967, issn 0169-4332, 3 p.Conference Paper

Detection of residual molybdenum impurity in CVD diamondKROMKA, A; KRAVETZ, R; PORUBA, A et al.Physica status solidi. A. Applied research. 2003, Vol 199, Num 1, pp 108-112, issn 0031-8965, 5 p.Conference Paper

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Contribution of nuclear analytical techniques in optimization of Li-Ge-O thin filmsROUX, F; BAUD, G; BLONDIAUX, G et al.Solid state ionics. 1997, Vol 104, Num 3-4, pp 177-181, issn 0167-2738Article

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Initial reactivity of rf magnetron sputtered calcium phosphate thin films in simulated body fluidsVAN DER WAL, E; WOLKE, J. G. C; JANSEN, J. A et al.Applied surface science. 2005, Vol 246, Num 1-3, pp 183-192, issn 0169-4332, 10 p.Article

Detection of hydrogen by electron Rutherford backscatteringVOS, Maarten.Ultramicroscopy. 2002, Vol 92, Num 3-4, pp 143-149, issn 0304-3991, 7 p.Article

Dielectric properties of CVD grown SiON thin films on Si for MOS microelectronic devicesKONOFAOS, N; EVANGELOU, E. K; ASLANOGLOU, X et al.Semiconductor science and technology. 2004, Vol 19, Num 1, pp 50-53, issn 0268-1242, 4 p.Article

Ultrashallow depth profiling using SIMS and ion scattering spectroscopyKATAOKA, Y; ITANI, T.Surface and interface analysis. 2007, Vol 39, Num 10, pp 826-831, issn 0142-2421, 6 p.Article

Ion scattering from 0.1 keV to 10 MeV : a brief reviewO'CONNOR, D. J.Mikrochimica acta (1966. Print). 1995, Vol 120, Num 1-4, pp 159-170, issn 0026-3672Conference Paper

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